Random telegraph noise in 2D hexagonal boron nitride dielectric films

Author:

Ranjan A.12ORCID,Puglisi F. M.3,Raghavan N.1,O'Shea S. J.2,Shubhakar K.1,Pavan P.3ORCID,Padovani A.4ORCID,Larcher L.5,Pey K. L.1ORCID

Affiliation:

1. Singapore University of Technology and Design, 8 Somapah Road, Singapore 487372

2. Institute of Materials Research and Engineering, A*STAR, 2 Fusionopolis Way, Singapore 138634

3. DIEF–Università di Modena e Reggio Emilia, Via P. Vivarelli 10/1, Modena 42125 Italy

4. MDLsoft Inc., 5201 Great America Parkway, Suite 320, Santa Clara, California 95054, USA

5. DISMI–Università di Modena e Reggio Emilia, Via Amendola 2, Reggio Emilia 42122, Italy

Funder

Singapore University of Technology and Design

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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3. Ga2O3 Bipolar Heterojunction-Based Optoelectronic Synapse Array with Visual Attention;The Journal of Physical Chemistry Letters;2024-01-10

4. Reliability Analysis of Random Telegraph Noisebased True Random Number Generators;2023 IEEE International Integrated Reliability Workshop (IIRW);2023-10-08

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