Development of a soft x-ray diffractometer for a wideband multilayer grating with a novel layer structure in the 2-4 keV range-Reference-Cited by-同舟云学术

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Development of a soft x-ray diffractometer for a wideband multilayer grating with a novel layer structure in the 2-4 keV range

Published:2012 Issue: Volume: Page:
ISSN:0094-243X
Container-title:AIP Conference Proceedings
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Author:

Imazono Takashi,Koike Masato,Kawachi Tetsuya,Hasegawa Noboru,Koeda Masaru,Nagano Tetsuya,Sasai Hiroyuki,Oue Yuki,Yonezawa Zeno,Kuramoto Satoshi,Terauchi Masami,Takahashi Hideyuki,Handa Nobuo,Murano Takanori

Publisher

AIP

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improvement study on heat resistance of multilayer-coated replica gratings;AIP Conference Proceedings;2019

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3. Development of a flat-field spectrometer with a wideband Ni/C multilayer grating in the 1–3.5 keV range;AIP Conference Proceedings;2016

4. Valence Electron Spectroscopy for Transmission Electron Microscopy;Transmission Electron Microscopy Characterization of Nanomaterials;2013-11-18

5. Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV;SPIE Proceedings;2013-09-27

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