Friction force microscopy using silicon cantilevers covered with organic monolayers via silicon–carbon covalent bonds
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1592613
Reference11 articles.
1. Friction measurements on phase-separated thin films with a modified atomic force microscope
2. Discriminating Molecular Length of Chemically Adsorbed Molecules Using an Atomic Force Microscope Having a Tip Covered with Sensor Molecules (An Atomic Force Microscope Having Chemical Sensing Function)
3. Functional Group Imaging by Chemical Force Microscopy
4. Modification of Silicon Nitride Tips with Trichlorosilane Self-Assembled Monolayers (SAMs) for Chemical Force Microscopy
5. Chiral discrimination by chemical force microscopy
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