Flexible memristors with low-operation voltage and high bending stability based on Cu2AgBiI6 perovskite

Author:

Chen Xinci1ORCID,Yin Xiang1ORCID,Li Zicong1,Meng Lingyu1ORCID,Han Xiaoli2,Zhang Zhijun3,Zhang Xianmin1ORCID

Affiliation:

1. Key Laboratory for Anisotropy and Texture of Materials (Ministry of Education), School of Material Science and Engineering, Northeastern University 1 , Shenyang 110819, China

2. Taian Weiye Electromechanical Technology Co., Ltd. 2 , Taian 271000, China

3. Liaoning Institute of Science and Technology 3 , Benxi 117004, China

Abstract

Cu2AgBiI6 films were prepared by a one-step spin coating method, and flexible memristors with an Ag/PMMA/Cu2AgBiI6/ITO structure were constructed. The devices showed a bipolar resistive switching behavior with low switching voltage, which is beneficial for reducing energy consumption. Furthermore, this study found that the device exhibits an endurance of about 900 cycles, a higher ON/OFF ratio of over 103, a long retention time (∼104 s), and high stabilities against mechanical stress. Remarkably, the present flexible memristor displayed extraordinary flexibility and stability, with no significant change for the resistive switching behavior even at various bending angles or after undergoing 900 bending cycles. This study establishes that the lead-free halide perovskite Cu2AgBiI6 can be used for the resistive random-access memory of flexible electronics.

Funder

National Natural Science Foundation of China

Liaoning Revitalization Talents Program

Fundamental Research Funds for the Central Universities

Publisher

AIP Publishing

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