Frequency modulation atomic force microscopy in ambient environments utilizing robust feedback tuning
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3073964
Reference23 articles.
1. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
2. Conservative and dissipative tip-sample interaction forces probed with dynamic AFM
3. Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique
4. Quantitative force measurements using frequency modulation atomic force microscopy?theoretical foundations
5. Novel amplitude and frequency demodulation algorithm for a virtual dynamic atomic force microscope
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