Add-on transmission attachments for the scanning electron microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1529301
Reference5 articles.
1. A High‐Resolution Scanning Transmission Electron Microscope
2. An add-on secondary electron energy spectrometer for scanning electron microscopes
3. A high-resolution mixed field immersion lens attachment for conventional scanning electron microscopes
4. A High Resolution Electron Spectrometer for Use in Transmission Scanning Electron Microscopy
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