Scanning diamond NV center probes compatible with conventional AFM technology-Reference-Cited by-同舟云学术

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Scanning diamond NV center probes compatible with conventional AFM technology

Published:2017-10-16 Issue:16 Volume:111 Page:163106
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Zhou Tony X.¹²,Stöhr Rainer J.¹³,Yacoby Amir¹²

Affiliation:

1. Department of Physics, Harvard University, 17 Oxford Street, Cambridge, Massachusetts 02138, USA

2. John A. Paulson School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138, USA

3. 3rd Institute of Physics, Research Center SCoPE and IQST, University of Stuttgart, 70569 Stuttgart, Germany

Funder

Gordon and Betty Moore Foundation

DOD | United States Army | RDECOM | Army Research Office

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4995813

Reference44 articles.

1. Surface magneto-optic Kerr effect

2. Magnetic Force Microscopy: Recent Advances and Applications

3. A. K. Petford-Long and J. N. Chapman , in Magnetic Microscopy of Nanostructures, edited by P. H. Hopster and P. H. P. Oepen ( Springer, Berlin, 2005), pp. 67–86.

4. SCANNING SQUID MICROSCOPY

5. A robust scanning diamond sensor for nanoscale imaging with single nitrogen-vacancy centres

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