Ultrasensitive method for current noise measurements
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2149220
Reference20 articles.
1. A. Van der Ziel, Noise: Sources, Characterization, Measurement (Prentice Hall, Englewood Cliffs, NJ, 1970), p. 54.
2. Noise as a diagnostic tool for quality and reliability of electronic devices
3. 1/f noise in MOS devices, mobility or number fluctuations?
4. Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise
5. Low-frequency noise behavior of SiO/sub 2/--HfO/sub 2/ dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness
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1. Low frequency 1/f noise in deep submicrometer-sized magnetic tunnel junctions;Journal of Applied Physics;2021-01-14
2. Universal Programmable DC Amplifier for Low Frequency Noise Measurements;2019 International Siberian Conference on Control and Communications (SIBCON);2019-04
3. Low frequency noise in magnetic tunneling junctions with Co 40 Fe 40 B 20 /Co 70.5 Fe 4.5 Si 15 B 10 composite free layer;Journal of Magnetism and Magnetic Materials;2016-01
4. Ultra-low-noise large-bandwidth transimpedance amplifier;International Journal of Circuit Theory and Applications;2014-08-14
5. Improvement of the accuracy of noise measurements by the two-amplifier correlation method;Review of Scientific Instruments;2013-10
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