Auger electron spectroscopy: Method for the accurate measurement of signal and noise and a figure of merit for the performance of AES instrument sensitivity-Reference-Cited by-同舟云学术

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Auger electron spectroscopy: Method for the accurate measurement of signal and noise and a figure of merit for the performance of AES instrument sensitivity

Published:1988-02 Issue:2 Volume:59 Page:217-227
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Seah M. P.,Hunt C. P.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1140230

Reference23 articles.

1. The quantitative analysis of surfaces by XPS: A review

2. Characterisation of computer differentiation of spectra in AES and its relation to differentiation by the modulation technique

3. Statistics of Electron Multiplication

4. A Microchannel Plate with Curved Channels: An Improvement in Gain, Relative Variance and Ion Noise for Channel Plate Tubes

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A system for the intensity calibration of electron spectrometers;Journal of Surface Analysis;2022

2. Noise in Auger electron spectra: a signal-processing view;Materiali in tehnologije;2019-02-19

3. A parallel acquisition charged particle energy analyser using a magnetic field;Surface and Interface Analysis;2016-06-08

4. Optimizing Certainty and the Detection Limit: Signal-to-Noise Ratio;Springer Series in Surface Sciences;2012-06-01

5. Simple Procedure for Precise Peak Maximum Estimation for Energy Calibration inAES andXPS;Surface and Interface Analysis;1996-09-30

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