Analysis of grain-boundary effects on the electrical properties of Pb(Zr,Ti)O3 thin films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1511280
Reference11 articles.
1. Temperature dependent fatigue rates in thin-film ferroelectric capacitors
2. Electronic domain pinning in Pb(Zr,Ti)O3thin films and its role in fatigue
3. Electrochemical models of failure in oxide perovskites
4. Quantitative measurement of space‐charge effects in lead zirconate‐titanate memories
5. Introduction of Selectively Nucleated Lateral Crystallization of Lead Zirconate Titanate Thin Films for Fabrication of High-Performance Ferroelectric Random Access Memory
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