Raman study of the network disorder in sputtered and glow dischargea‐Si:H films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.359743
Reference32 articles.
1. Structural Equilibration in Pure and Hydrogenated Amorphous Silicon
2. Determination of energy barrier for structural relaxation in a-Si and a-Ge by Raman scattering
3. Dynamics of tetrahedral networks: Amorphous Si and Ge
4. Structural information from the Raman spectrum of amorphous silicon
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