A multi-stop time-of-flight spectrometer for the measurement of positron annihilation-induced electrons in coincidence with the Doppler-shifted annihilation gamma photon-Reference-Cited by-同舟云学术

A multi-stop time-of-flight spectrometer for the measurement of positron annihilation-induced electrons in coincidence with the Doppler-shifted annihilation gamma photon

Published:2020-03-01 Issue:3 Volume:91 Page:033903
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Chirayath V. A.¹^ORCID,Gladen R. W.¹^ORCID,McDonald A. D.¹,Fairchild A. J.¹^ORCID,Joglekar P. V.¹,Satyal S.¹^ORCID,Lim Z. H.¹,Shead T. N.¹,Chrysler M. D.¹,Mukherjee S.¹²^ORCID,Barnett B. M.¹,Byrnes N. K.¹,Koymen A. R.¹,Greaves R. G.³,Weiss A. H.¹

Affiliation:

1. Department of Physics, University of Texas at Arlington, Arlington, Texas 76019, USA

2. Radiochemistry Division, Bhabha Atomic Research Center, Trombay, Mumbai 400085, India

3. First Point Scientific Inc., Agoura Hills, California 91301, USA

Funder

National Science Foundation

Welch Foundation

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5140789

Reference48 articles.

1. Interaction of positron beams with surfaces, thin films, and interfaces

2. Positrons in surface physics

3. Defect identification in semiconductors with positron annihilation: Experiment and theory

4. Characterization of lattice defects in metallic materials by positron annihilation spectroscopy: A review

5. Theory of positrons in solids and on solid surfaces

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