Modeling interface-controlled phase transformation kinetics in thin films
Author:
Affiliation:
1. Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
2. NanoAl LLC, Skokie, Illinois 60077, USA
3. Groupe de Physique des Matériaux, Normandie Université, Saint Etienne du Rouvray 76801, France
Funder
National Science Foundation (NSF)
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4919725
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4. Amorphous-to-Crystalline Transformation of Thin ITO Films Studied by In-Situ Grazing Incidence X-Ray Diffractometry
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