Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm-Reference-Cited by-同舟云学术

Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

Published:2016-12 Issue:12 Volume:87 Page:123106
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Rev. Sci. Instrum.

Author:

Dinh Thanh Hung¹²,Kondo Yoshiki¹,Tamura Toshiki¹,Ono Yuichi¹,Hara Hiroyuki¹,Oikawa Hiroki¹,Yamamoto Yoichi²,Ishino Masahiko²,Nishikino Masaharu²,Makimura Tetsuya³,Dunne Padraig⁴,O’Sullivan Gerry⁴,Ohta Shigeru⁵,Kitano Ken⁵,Ejima Takeo⁶,Hatano Tadashi⁶,Higashiguchi Takeshi¹^ORCID

Affiliation:

1. Department of Electrical and Electronic Engineering, Faculty of Engineering and Center for Optical Research and Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan

2. Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology (QST), 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan

3. Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan

4. School of Physics, University College Dublin, Belfield, Dublin 4, Ireland

5. Vacuum and Optical Instruments, 2-18-18 Shimomaruko, Ohta-ku, Tokyo 146-0092, Japan

6. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan

Funder

Science Foundation Ireland (SFI)

Ministry of Education, Culture, Sports, Science, and Technology (MEXT)

Publisher

AIP Publishing

Subject

Instrumentation

Reference30 articles.

1. Nanoscale X-ray imaging

2. High-resolution compact X-ray microscopy

3. Lensless Diffractive Imaging Using Tabletop Coherent High-Harmonic Soft-X-Ray Beams

4. Near-edge x-ray absorption fine structure measurements using a laboratory-scale XUV source

5. Quasi-Moseley's law for strong narrow bandwidth soft x-ray sources containing higher charge-state ions

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