Real time spectroscopic ellipsometry characterization of structural and thermal equilibration of amorphous silicon–carbon alloy p layers in p-i-n solar cell fabrication-Reference-Cited by-同舟云学术

Real time spectroscopic ellipsometry characterization of structural and thermal equilibration of amorphous silicon–carbon alloy p layers in p-i-n solar cell fabrication

Published:1998-08-15 Issue:4 Volume:84 Page:2278-2286
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Fujiwara H.,Koh Joohyun,Lee Yeeheng,Wronski C. R.,Collins R. W.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.368361

Reference28 articles.

1. Bandgap engineering of amorphous semiconductors for solar cell applications

2. A novel structure, high conversion efficiency p‐SiC/graded p‐SiC/i‐Si/n‐Si/metal substrate‐type amorphous silicon solar cell

3. Amorphous siliconp‐i‐nsolar cells with graded interface

4. Improvement of Hydrogenated Amorphous Silicon n-i-p Diode Performance by H2Plasma Treatment for i/p Interface

5. Defect and Band Gap Engineering of Amorphous Silicon Solar Cells

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2. Real-time monitoring and process control in amorphous∕crystalline silicon heterojunction solar cells by spectroscopic ellipsometry and infrared spectroscopy;Applied Physics Letters;2005-01-17

3. Application of Spectroscopic Ellipsometry and Infrared Spectroscopy for the Real-Time Control and Characterization of a-Si:H Growth in a-Si:H/c-Si Heterojunction Solar Cells;MRS Proceedings;2005

4. Temperature dependence of the optical functions of amorphous silicon-based materials: application to in situ temperature measurements by spectroscopic ellipsometry;Thin Solid Films;2004-12

5. Hydrogenated amorphous silicon carbon alloys for solar cells;Thin Solid Films;2002-02