Direct measurements of compressive and tensile strain during shock breakout by use of subnanosecond x‐ray diffraction
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.346158
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3. Molecular dynamics simulations of shock-compressed single-crystal silicon;Physical Review B;2014-02-10
4. Pulsed X-ray diffraction structure study of shocked materials;Physics-Uspekhi;2011-04-30
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