Low Si‐contamination GaP LPE layers grown at 650 °C from indium solvent
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.90300
Reference10 articles.
1. Evidence for a primarily nonradiative Si,O defect in GaP
2. Optical Properties of the Group IV Elements Carbon and Silicon in Gallium Phosphide
3. Synthesis of Gallium Phosphide
4. Pair Spectra and "Edge" Emission in Gallium Phosphide
5. Properties of Sn‐doped GaAs
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Acetylene;Encyclopedia of Physical Science and Technology;2003
2. Minority carrier diffusion length in LPE InxGa1−xP: N layers (x < 0.01);Solid-State Electronics;1982-10
3. Low temperature growth of GaP LPE layers from indium solvent;Journal of Crystal Growth;1979-05
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