Detection of short range order in SiO2 thin-films by grazing-incidence wide and small-angle X-ray scattering
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4947053
Reference36 articles.
1. Si→SiO2transformation: Interfacial structure and mechanism
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