Impact of barrier layer on HfO2-based conductive bridge random access memory
Author:
Affiliation:
1. Institute of Electronics, National Chiao Tung University, Hsinchu 30010, Taiwan
Funder
Ministry of Science and Technology, Taiwan
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5087421
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