Polarized neutron reflectometry study of depth dependent magnetization variation in Co thin film due to strain transfer from PMN-PT substrate-Reference-Cited by-同舟云学术

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Polarized neutron reflectometry study of depth dependent magnetization variation in Co thin film due to strain transfer from PMN-PT substrate

Published:2018-09-21 Issue:11 Volume:124 Page:113903
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Al-Rashid Md Mamun¹²,Bhattacharya Dhritiman¹,Grutter Alexander³^ORCID,Kirby Brian³,Atulasimha Jayasimha¹²

Affiliation:

1. Mechanical and Nuclear Engineering, Virginia Commonwealth University, Richmond, Virginia 23284, USA

2. Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, Virginia 23284, USA

3. NIST Center for Neutron Research, NIST, Gaithersburg, Maryland 20899, USA

Funder

National Science Foundation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5037601

Reference35 articles.

1. Room Temperature Magnetic Quantum Cellular Automata

2. Nanocomputing by field-coupled nanomagnets

3. Interacting systems for self-correcting low power switching

5. Architecting for Causal Intelligence at Nanoscale

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Review: Voltage induced strain control of magnetization: computing and other applications;Multifunctional Materials;2019-09-10

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