Subcutoff microwave driven plasma ion sources for multielemental focused ion beam systems
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2943341
Reference24 articles.
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5. Experiment combining ion-beam sputtering and quantitative ICP-OES analysis: angular distributions and total yield of titanium sputtered by 5 keV krypton ions
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