Development and testing of an active high voltage saturation probe for characterization of ultra-high voltage silicon carbide semiconductor devices
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Published:2015-08
Issue:8
Volume:86
Page:085104
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Bilbao Argenis V.,
Schrock James A.ORCID,
Ray William B.,
Kelley Mitchell D.,
Holt Shad L.ORCID,
Giesselmann Michael G.,
Bayne Stephen B.
Cited by
2 articles.
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