Separation of bulk and contact interface degradation in thin film silicon solar cells
Author:
Affiliation:
1. Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, United Kingdom
2. Department of Technology, University of Applied Sciences Bielefeld, Minden D-32427, Germany
Funder
ENIAC-JU projects E2SG and ERG
Consejo Nacional de Ciencia y Tecnología (CONACYT)
Publisher
AIP Publishing
Subject
Renewable Energy, Sustainability and the Environment
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4936592
Reference37 articles.
1. Reversible conductivity changes in discharge‐produced amorphous Si
2. Light-induced metastable defects in hydrogenated amorphous silicon: A systematic study
3. Metastable hydrogen atom trapping in hydrogenated amorphous silicon films: A microscopic model for metastable defect creation
4. Intrinisic reliability of amorphous silicon thin film solar cells
5. Structural and electrical properties of metastable defects in hydrogenated amorphous silicon
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