Pulsed Raman measurements of lattice temperature: Validity tests
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.331771
Reference24 articles.
1. Raman Measurement of Lattice Temperature during Pulsed Laser Heating of Silicon
2. Pulsed Raman measurement of the onset of recrystallization in laser annealing
3. Time-reversal invariance and Raman measurements of phonon populations under nonequilibrium conditions
4. Raman scattering with nanosecond resolution during pulsed laser annealing of silicon
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1. Simultaneous measurements of Stokes and anti-Stokes Raman spectra for thermal characterization of diode laser facet;J RAMAN SPECTROSC;1996
2. Probing Structure, Spectroscopy, Kinetics, and Dynamics on Metal Surfaces by Optical Second Harmonic Generation;Journal of the Chinese Chemical Society;1995-04
3. Migration of Carbon in Tempered Martensitic Steel During Excimer Laser Melting;MRS Proceedings;1989
4. Phonon populations by nanosecond-pulsed Raman scattering in Si;Physical Review B;1985-11-15
5. Second-harmonic and sum-frequency generation in reflection: probing of GaAs surface structure and laser-induced phase transitions;Journal of the Optical Society of America B;1985-02-01
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