Simultaneous reflectometry and interferometry for measuring thin-film thickness and curvature-Reference-Cited by-同舟云学术

Simultaneous reflectometry and interferometry for measuring thin-film thickness and curvature

Published:2018-05 Issue:5 Volume:89 Page:055117
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Arends A. A.¹^ORCID,Germain T. M.¹,Owens J. F.¹,Putnam S. A.¹^ORCID

Affiliation:

1. Department of Mechanical and Aerospace Engineering, College of Engineering and Computer Science, University of Central Florida, Orlando, Florida 32816, USA

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5021704

Reference19 articles.

1. Fluid flow and heat transfer in the evaporating thin film region

2. Microscale temperature measurement at an evaporating liquid meniscus

3. Evaporation from a two-dimensional extended meniscus

4. Analysis of the Effects of Marangoni Stresses on the Microflow in an Evaporating Sessile Droplet

5. Microscale heat transfer in an evaporating moving extended meniscus

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