Control on the density and optical properties of color centers at SiO2/SiC interfaces by oxidation and annealing

Abstract

Color centers in solids can serve as single photon emitters (SPEs) those are important in many quantum applications. Silicon carbide (SiC) is a promising host for color centers because of its well-established crystal growth and device technologies. Although color centers with extremely high brightness were found at the silicon dioxide (SiO2)/SiC interface, controlling their density and optical properties remains a challenge. In this study, we demonstrate control over the color centers at the SiO2/SiC interface by designing the oxidation and annealing conditions. We report that post-oxidation CO2 annealing has the ability to reduce the color centers at the interface and form well-isolated SPEs with bright emission. We also discuss the correlation between the color centers and electrically active defects.