Source effects in analyzer-based X-ray phase contrast imaging with conventional sources-Reference-Cited by-同舟云学术

Source effects in analyzer-based X-ray phase contrast imaging with conventional sources

Published:2012-11 Issue:11 Volume:83 Page:113702
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Hönnicke M. G.,Manica J.,Mazzaro I.,Cusatis C.,Huang X.-R.

Funder

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4767243

Reference30 articles.

1. M. Ando and S. Hosoya, in Proceedings of the 6th International Conference on X-ray Optics and Microanalysis, edited by G. Shinoda et al. (University of Tokyo Press, 1972), pp. 63–68.

2. Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources

3. Phase-contrast imaging using polychromatic hard X-rays

4. Observation of microstructure and damage in materials by phase sensitive radiography and tomography

5. Long and compact x-ray pathway for experiments requiring high coherent x-ray beams

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