A dynamic optical constant extraction method for thin films with structural and optical-parametric justifications-Reference-Cited by-同舟云学术

A dynamic optical constant extraction method for thin films with structural and optical-parametric justifications

Published:2020-11-21 Issue:19 Volume:128 Page:195301
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Zubair M. A.¹^ORCID,Chowdhury M. T.²^ORCID

Affiliation:

1. Department of Glass and Ceramic Engineering, Bangladesh University of Engineering and Technology (BUET), Dhaka 1000, Bangladesh

2. Institute of Energy Science, Atomic Energy Research Establishment, Bangladesh Atomic Energy Commission (BAEC), P.O. Box 3787, Dhaka 1000, Bangladesh

Funder

Committee for Advanced Study and Research, BUET

The Ministry of Science and Technology, Bangladesh

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0027370

Reference55 articles.

1. Determination of the thickness and optical constants of amorphous silicon

2. Determination of Optical Constants from Intensity Measurements at Normal Incidence

3. Determination of the optical constants of a thin film from transmittance measurements of a single film thickness

4. Absolute Infrared Intensity Measurements in Thin Films

5. Optical constants of magnetron-sputtered magnesium films in the 25–1300 eV energy range

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