Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM-Reference-Cited by-同舟云学术

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Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM

Published:2019-03-14 Issue:10 Volume:125 Page:105303
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Lee Lok Yi¹^ORCID,Frentrup Martin¹,Vacek Petr¹²,Kappers Menno J.¹,Wallis David J.¹³^ORCID,Oliver Rachel A.¹^ORCID

Affiliation:

1. Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom

2. Institute of Physics of Materials & CEITEC IPM, Academy of Sciences of the Czech Republic, Žižkova 22, 61600 Brno, Czech Republic

3. Centre for High Frequency Engineering, University of Cardiff, 5 The Parade, Newport Road, Cardiff CF24 3AA, United Kingdom

Funder

Innovate UK

Engineering and Physical Sciences Research Council

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5082846

Reference13 articles.

1. Phase Transformations and Phase Stability in Epitaxialβ-GaN Films

2. Characterization of Group III-nitride semiconductors by high-resolution electron microscopy

3. Structural properties of undoped and doped cubic GaN grown on SiC(001)

4. Growth of cubic GaN on nano-patterned 3C-SiC/Si (0 0 1) substrates

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Xe+ and Ga+ milling species on the cathodoluminescence of wurtzite and zincblende GaN;Journal of Applied Physics;2024-07-22

2. Active Control of Temperature‐Sensitive GaN‐Graphene van der Waals Heterojunctions Integrated Metasurfaces: A Platform for Multifunctional Micro–Nanophotonic Devices;Advanced Optical Materials;2024-07-22

3. Cathodoluminescence studies of the optical properties of a zincblende InGaN/GaN single quantum well;Nanotechnology;2024-07-11

4. Epitaxial Growth of the Large-Scale, Highly-Ordered 3D GaN-Truncated Pyramid Array Toward an Ultrahigh Rejection Ratio and Responsivity Visible-Blind Ultraviolet Photodetection;ACS Applied Materials & Interfaces;2024-07-01

5. Atom Probe Tomography Investigation of the Impact of Stacking Faults on InGaN/GaN Quantum Well LED Systems;Microscopy and Microanalysis;2024-07

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