Measurement of surface recombination velocity in semiconductors by diffraction from picosecond transient free‐carrier gratings
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.90428
Reference21 articles.
1. Investigation of non-equilibrium processes in semiconductors by the method of transient holograms
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5. Ambipolar diffusion measurements in semiconductors using nonlinear transient gratings
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