Domain wall pinning on strain relaxation defects (stacking faults) in nanoscale FePd (001)/MgO thin films-Reference-Cited by-同舟云学术

Domain wall pinning on strain relaxation defects (stacking faults) in nanoscale FePd (001)/MgO thin films

Author:

Hsiao C. H.¹^ORCID,Yao Y. D.²,Lo S. C.³,Chang H. W.⁴,Ouyang Chuenhou (Hao)¹

Affiliation:

1. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan

2. Institute of Physics, Academia Sinica, Taipei 11529, Taiwan

3. Material and Chemical Research Laboratories and Nanotechnology Research Center, Industrial Technology Research Institute, Hsinchu 31040, Taiwan

4. Department of Applied Physics, Tunghai University, Taichung 40704, Taiwan

Funder

Ministry of Science and Technology, Taiwan (MOST)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

Reference45 articles.

2. R. M. Bozorth ,Ferromagnetism( Wiley-IEEE Press, 1951), p.411.

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献