Strain variations in InGaAsP/InGaP superlattices studied by scanning probe microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.121165
Reference17 articles.
1. Nanoscale characterization of semiconductor materials and devices using scanning probe techniques
2. Nanoscale characterization of semiconductor materials and devices using scanning probe techniques
3. Epitaxial layer thickness measurement by cross‐sectional atomic force microscopy
4. Epitaxial layer thickness measurement by cross‐sectional atomic force microscopy
5. Epitaxial layer thickness measurement by cross‐sectional atomic force microscopy
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