Direct synchrotron x‐ray topography of moving domain walls in Fe : Si single crystals

Author:

Hartmann W.,Hagen W.,Miltat J.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. X-ray and neutron topographical studies of magnetic materials;Physica B: Condensed Matter;1993-10

2. Real-time and stroboscopic topography;Progress in Crystal Growth and Characterization;1987-01

3. Observation of domain structure in a (111) oriented grain of Fe(Si) by X-ray white beam topography;physica status solidi (a);1985-02-16

4. X-ray topographic assessment of dislocations in crystals grown from solution;Progress in Crystal Growth and Characterization;1985-01

5. Economical on-line image processing of synchrotron x-radiation topographs;Nuclear Instruments and Methods in Physics Research;1983-04

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