Concerning a hole trap in α-Al2O3:C,Mg

Abstract

We report the existence of a hole trap in α-Al2O3:C,Mg as determined using thermoluminescence (TL) and optically stimulated luminescence (OSL). The associated experiments are based on the hypotheses that if a TL glow peak is associated with a hole trap in the glow curve of α-Al2O3:C,Mg, that hole trap will not participate in any light-induced electron-transfer process and its removal will not cause the OSL intensity to decrease. To examine the first hypothesis, a TL glow curve was recorded at 1 °C/s to establish the position of glow peaks. There is a high intensity peak at 184 °C (labeled as peak IV) and eight secondary peaks at 48, 80, 108, 228, 288, 320, 386, and 426 °C (peaks I, II, III, and V–IX). The light-induced charge transfer between various electron traps associated with the peaks was studied. This study reveals that all peaks except the one at 228 °C (peak V) participate in the charge-transfer process. A test of the second hypothesis shows that peak V is also not reproduced by illumination (phototransfer), and the depletion of this peak does not influence the charge-transfer process. An additional study on the effect of temperature on the TL and OSL intensity was carried out to further assess the nature of the charge traps associated with the peaks. The depletion of peak V does not affect the OSL intensity. The results from both experiments are clear evidence consistent with the hypothesis that the charge trap associated with peak V is a hole trap.