Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry-Reference-Cited by-同舟云学术

Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry

Published:2014-01 Issue:1 Volume:2 Page:012113
ISSN:2166-532X
Container-title:APL Materials
language:en
Short-container-title:APL Materials

Author:

Chávez-Ángel E.,Reparaz J. S.,Gomis-Bresco J.,Wagner M. R.,Cuffe J.,Graczykowski B.,Shchepetov A.,Jiang H.,Prunnila M.,Ahopelto J.,Alzina F.,Sotomayor Torres C. M.

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4861796

Reference46 articles.

1. Heat transport in silicon from first-principles calculations

2. Broadband phonon mean free path contributions to thermal conductivity measured using frequency domain thermoreflectance

3. Enhancement of Thermoelectric Figure-of-Merit by a Bulk Nanostructuring Approach

4. Bulk nanostructured thermoelectric materials: current research and future prospects

5. Thermal Conductivity of Silicon and Germanium from 3°K to the Melting Point

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