Charge retention of MNOS devices limited by Frenkel‐Poole detrapping
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.90014
Reference12 articles.
1. Discharge of MNOS structures
2. Endurance and memory decay of MNOS devices
3. Transient charge and current distributions in the nitride of MNOS devices
4. Effects of bulk trapping on the memory characteristics of thick-oxide MNOS variable-threshold capacitors
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