Scanning SQUID sampler with 40-ps time resolution-Reference-Cited by-同舟云学术

Scanning SQUID sampler with 40-ps time resolution

Published:2017-08 Issue:8 Volume:88 Page:083703
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Cui Zheng¹²³,Kirtley John R.²,Wang Yihua³,Kratz Philip A.²³,Rosenberg Aaron J.²³^ORCID,Watson Christopher A.¹³,Gibson Gerald W.⁴,Ketchen Mark B.⁵,Moler Kathryn. A.¹²³

Affiliation:

1. Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA

2. Geballe Laboratory for Advanced Materials, Stanford University, Stanford, California 94305, USA

3. Department of Applied Physics, Stanford University, Stanford, California 94305, USA

4. IBM Watson Research Center, Yorktown Heights, New York 10598, USA

5. OcteVue, Hadley, Massachusetts 01035, USA

Funder

Function Accelerated nanoMaterial Engineering

National Science Foundation (NSF)

U.S. Department of Energy (DOE)

Gordon and Betty Moore Foundation (Gordon E. and Betty I. Moore Foundation)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4986525

Reference18 articles.

1. F. P. Rogers, “A device for experimental observation of flux vortices trapped in superconducting thin films,” M.S. thesis, Massachusetts Institute of Technology, 1983.

2. Design and implementation of a scanning SQUID microscope

3. Magnetic microscopy using a liquid nitrogen cooled YBa2Cu3O7superconducting quantum interference device

4. High‐resolution scanning SQUID microscope

5. Scanning SQUID susceptometers with sub-micron spatial resolution

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