Z-contrast and electron energy loss spectroscopy study of passive layer formation at ferroelectric PbTiO3∕Pt interfaces
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2144279
Reference13 articles.
1. Physics of ferroelectric thin-film memory devices
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3. Identification of passive layer in ferroelectric thin films from their switching parameters
4. Abrupt Appearance of the Domain Pattern and Fatigue of Thin Ferroelectric Films
5. The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. I. Dopant, illumination, and bias dependence
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