Microscopic analysis of generation-recombination noise in semiconductors under dc and time-varying electric fields
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.373739
Reference21 articles.
1. Semiconductor impurity analysis from low-frequency noise spectra
2. Correlation measurement of carrier multiplication noise sources in MOS transistors at low frequencies
3. Low-frequency generation noise in junction field effect transistors
4. The role of baseband noise and its upconversion in HBT oscillator phase noise
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3. Cyclostationary noise modeling of radio frequency devices;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2014-11-12
4. Experimental characterization of the cyclostationary low-frequency noise of microwave semiconductor devices under large signal operation;International Journal of Microwave and Wireless Technologies;2010-04
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