Measurement of the static error rate of a storage cell for single magnetic flux quanta, fabricated from high-Tc multilayer bicrystal Josephson junctions-Reference-Cited by-同舟云学术

Measurement of the static error rate of a storage cell for single magnetic flux quanta, fabricated from high-Tc multilayer bicrystal Josephson junctions

Published:1998-03-23 Issue:12 Volume:72 Page:1513-1515
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Chong Y.,Ruck B.,Dittmann R.,Horstmann C.,Engelhardt A.,Wahl G.,Oelze B.,Sodtke E.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.121043

Reference10 articles.

1. RSFQ logic/memory family: a new Josephson-junction technology for sub-terahertz-clock-frequency digital systems

2. A 3 bit single flux quantum shift register based on high-Tc bicrystal Josephson junctions operating at 50 K

3. All‐high‐Tc superconductor rapid‐single‐flux‐quantum circuit operating at ∼30 K

4. Error rate of a superconducting circuit

5. Correlation between ramp morphology and properties of ramp-type junctions

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