Annealing treatment of focused gallium ion beam processing of SERS gold substrate
Author:
Affiliation:
1. School of Precision Instrument and Opto-Electronic Engineering, Tianjin University, Tianjin 300072, China
2. School of Electronic and Information Engineering, Liaoning University of Science and Technology, Anshan 114051, China
Publisher
AIP Publishing
Subject
Automotive Engineering
Link
https://aip.scitation.org/doi/pdf/10.1063/10.0007286
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