Recess-free thin-barrier AlGaN/GaN Schottky barrier diodes with ultra-low leakage current: Experiment and simulation study

Abstract

In GaN Schottky barrier diodes (SBD), there is a trade-off between the turn-on voltage and the leakage current. In this study, recess-free 4 nm-thin-barrier AlGaN/GaN SBDs with minimal leakage current as well as excellent turn-on voltage homogeneity are developed, which enable better electrical control to pinch off the 2DEG channel under the anode region and avoids trap introduced in the barrier etching process. In detail, the effect of reverse stress on the SBD performance is initially explored by using differential conductance, and then, the anode-to-cathode distances and temperatures dependence of SBDs output characteristics are systematically studied. The fabricated thin-barrier GaN SBDs show a turn-on voltage of ∼0.75 V and a low level leakage current of 9.66 × 10−10 (1.91 × 10−8) A/mm at 300 (423) K, which is among the lowest reported values at the comparable reverse bias voltage and temperature. Moreover, structure parameters of the thin-barrier AlGaN/GaN SBD are systematically modeled and optimized by the TCAD simulations, including anode metal work function, Al mole fraction, the anode-to-cathode distance, and slanted anode angle. The introduction of slanted anode is found to have significant effect on the improvement of reverse breakdown voltage and leakage current characteristics.