Differential ultra low noise amplifier for low frequency noise measurements
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Reference17 articles.
1. Noise as a diagnostic tool for quality and reliability of electronic devices
2. Low-frequency noise measurements as a characterization tool for degradation phenomena in solid-state devices
3. Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors
4. The noise is the signal
5. The status of Johnson noise thermometry
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