Structural and electrical properties of low pressure metalorganic chemical vapor deposition grown Eu2O3 films on Si(100)
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2388128
Reference15 articles.
1. Comparison of the chemical and physical properties of f-element metals and oxides: their dependence on electronic properties
2. Correlated structural and optical properties of thin Eu oxide films
3. Correlated structural and optical properties of thin Eu oxide films
4. Dielectric and optical properties of europium oxide films
5. Conduction Studies on Europium Oxide Thin Films
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2. Communication—Wide Bandgap Tin Oxide Thin Film Transistor by Doping Rare Earth Element Europium;ECS Journal of Solid State Science and Technology;2020-07-10
3. Electronic structure studies of Fe doped Eu 2 O 3 thin film using x-ray absorption and resonant photoemission spectroscopy;Journal of Alloys and Compounds;2017-07
4. Effect of transition metal ion substitution on structural and magnetic properties of Eu2O3 sesquioxide system;Journal of Materials Science: Materials in Electronics;2017-05-03
5. Observation of red electroluminescence from an Eu2O3/p+-Si device and improved performance by introducing a Tb2O3layer;Journal of Physics D: Applied Physics;2017-02-10
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