Author:
Sanwald R. C.,Ranganathan S.,Hren J. J.
Subject
Physics and Astronomy (miscellaneous)
Cited by
22 articles.
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1. Computers in field ion microscopy;Physica Status Solidi (a);1980-09-16
2. Application of field-ion microscopy to the study of grain boundary dislocations;Scripta Metallurgica;1979-05
3. Applications of computer simulation to materials research;Proceedings of the Indian Academy of Sciences Section C: Engineering Sciences;1979-03
4. DEVELOPMENTS IN FIELD ION MICROSCOPY;Diffraction and Imaging Techniques in Material Science;1978
5. The imaging process in field ion microscopy from the fem to the atom‐probe;C R C Critical Reviews in Solid State Sciences;1976-04