An x-ray rocking curve technique for the absolute characterization of epitaxial layers and single-crystal solids
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1447012
Reference17 articles.
1. Precision lattice constant determination
2. Automated X Ray Topography and Rocking Curve Analysis: A Readability Study
3. Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal Topography
4. Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs
5. Determination of the lattice constant of epitaxial layers of III-V compounds
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