Nanoscale interaction layer at the interface between Al films and SiO2 substrates of Al/AlOx/Al Josephson tunnel junctions
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4801798
Reference30 articles.
1. Improving the coherence time of superconducting coplanar resonators
2. 1/f noise of Josephson-junction-embedded microwave resonators at single photon energies and millikelvin temperatures
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4. Quantum Noise in the Josephson Charge Qubit
5. Decoherence in Josephson Qubits from Dielectric Loss
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1. Single-particle states spectroscopy in individual carbon nanotubes with an aid of tunneling contacts;Applied Physics Letters;2022-02-21
2. Light Transmission and Surface Topography of KU-1 Optical Quartz After Sputtering and Cleaning from Al Films in RF Discharge of H2(D2)–Ne Mixtures;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2021-09
3. The atomic details of the interfacial interaction between the bottom electrode of Al/AlOx/Al Josephson junctions and HF-treated Si substrates;Journal of Applied Physics;2015-04-28
4. Impact of SiO2on Al–Al thermocompression wafer bonding;Journal of Micromechanics and Microengineering;2015-02-12
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