A scanning nonlinear dielectric microscopic investigation of potential-induced degradation in monocrystalline silicon solar cells-Reference-Cited by-同舟云学术

A scanning nonlinear dielectric microscopic investigation of potential-induced degradation in monocrystalline silicon solar cells

Published:2020-05-04 Issue:18 Volume:116 Page:182107
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Cho Yasuo¹^ORCID,Jonai Sachiko²,Masuda Atsushi²^ORCID

Affiliation:

1. Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan

2. National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

Funder

Japan Society for the Promotion of Science

New Energy and Industrial Technology Development Organization

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0004091

Reference12 articles.

1. Origin of Na causing potential-induced degradation for p-type crystalline Si photovoltaic modules

2. J. Berghold , O. Frank , H. Hoehne , S. Pingel , B. Richardson , and M. Winkler , in Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition, Valencia, Spain (2010), p. 3753.

3. P. Hacke , M. Kempe , K. Terwilliger , S. Glick , N. Call , S. Johnston , S. Kurtz , I. Bennett , and M. Kloos , in Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition, Valencia, Spain (2010), p. 3760.

4. Potential-induced degradation in photovoltaic modules: a critical review

5. Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells

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