Choice of tip, signal stability, and practical aspects of piezoresponse-force-microscopy
Author:
Affiliation:
1. Institute for Materials Research, University of Leeds, Engineering Building, LS2 9JT Leeds, United Kingdom
Funder
European Commission (EC)
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4929572
Reference12 articles.
1. Piezoresponse force microscopy (PFM)
2. Domain structure and polarization reversal in ferroelectrics studied by atomic force microscopy
3. Direct studies of domain switching dynamics in thin film ferroelectric capacitors
4. Unraveling Deterministic Mesoscopic Polarization Switching Mechanisms: Spatially Resolved Studies of a Tilt Grain Boundary in Bismuth Ferrite
5. Spatial resolution, information limit, and contrast transfer in piezoresponse force microscopy
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