Imaging of the silicon on sapphire interface by high‐resolution transmission electron microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.92389
Reference15 articles.
1. Crystallographic match in epitaxy between silicon and sapphire
2. Single Crystal Silicon Epitaxy on Foreign Substrates
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